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  • Author(s): Horng-Yuan Yen, Wen-Tzong Liang, Ban-Yuan Kuo, Yih-Hsiung Yeh, Char-Shuan Liu, Donald Reed, Neil Lundberg, Fu-Chen Su, Hou-Sheng Chung
  • DOI:

    10.3319/TAO.1995.6.2.233(T)

  • Keywords:

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